Due to the unique dielectric materials under development here at SciGenesis, we have found it is necessary to design and engineer our own instrumentation, especially in areas such as the measurement of thin film volume charge distribution of small samples. Below is a schematic of just such a piece of equipment, referred to in the engineering world as a parallel plate capacitor box, this well thought out piece of equipment works in conjunction with our Keithley Inc. Model 4200 SCS Semi-conductor characterization system. This provides us with the capabilities to measure dielectric properties of extremely thin nanocomposite materials in reasonable sample sizes before production of these films is scaled up to a size reasonable for more traditional dielectric measurements.
Some pictures of our box in use in the lab
 
So, whether you simply need testing of your product or would like us to test your samples for you, or custom design and build instrumentation that fits your needs, feel free to contact us. We provide great services, unique solutions and reliable results at very reasonable rates!
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